中文版 English
 
Hot news:
  Products
IEC Test Probe
IPX1-IPX9K Waterproof Test Equipment
Safety testing equipment
Soil Sensor
Environmental Test Chamber
Textile Test Equipment
Battery test equipment
Mechanical testing machine
Plug and socket testing equipment
test package
Hot Product
UL1439 Sharp Edge Tester
BND-TPK05 Test Probe Kits
IEC61032 12.5mm steel ball IPX...
IEC61032 IP4X Test Probe D (Te...
IPX1 to IPX4 Drip rain test an...
API certified API thread ring ...
IEC60065 Rigid Test Finger Pro...
IEC60084 1N/20N Test Probe Pi...
IEC61032 Test Probe 31(Ground ...
IEC61032 Rigid Test Finger Pro...
ul507 PA160B Test Probe
IEC60335 Test Finger Nail
 
 
Products
S5366 The wedge probe
Name:S5366 The wedge probe
Type:BND-X102
Manufacturer:This product is used for testing access to document shredders.
Product Description:

S5366 The wedge probe


Model:BND-X102


1.Specification :

Length                      :   300mm

Width                        :   50mm

Bendable Section :   30/30/40mm

Material                :   Stainless steel

Reference             :   UL60950 Fig NAF.2 and NAF.3


Distance from probe tip Probe thickness

Distance from probe tip

Probe thickness

0mm

2mm

12mm

4mm

180mm

24mm


2,Appliance:


This product is used for testing access to document shredders. The Jointed Accessibility Wedge Probe is a high precision probe made in exact accordance with UL and IEC standards such as UL60950 Figure NAF2 and NAF3 UL 60950 wedge probe for paper shredders .

The wedge probe is made of solid aluminum to conserve weight yet maintain rigidity. Others maintain that the tip needs to be more rigid, because of the cutting blades. This underscores their lack of knowledge of the requirements as you do not perform the test with the unit energized! No damage can occur to the probe unless the shredder is energized - - in which case there is extreme danger in performing the test! The Shredder Accessibility Probe is intended for testing paper shredders in accordance with Annex NAF of the Standard for Information Technology Equipment, UL60950-1:2006

3,Note :

1 The thickness of the probe varies linearly, with slope changes at the following points along the probe:

2 Tolerances on the probe measurement values are ±0.127 mm.

Figure NAF.2 – Accessibility probe/wedge (overall view)


 
Home  |  Products  |  News  |  About us  |  Feedback  |  Contact us  |  
Copyright © 2008-2015 HongKong Bonad Technology Limited Shenzhen Bonad Instrument Co., LTD. All Rights Reserved.
 
    Add:C505, Hongdu Building,Bao\\'an45 district,Shenzhen,518101,Guangdong Province,China    Tel:0755-27337191    Fax:0755-23721200    Email:Alice@szbonad.com