IEC61032 Test Probe Kits BND-TPK06

Model:BND-TPK06

Product Details

· BND-B: IEC Jointed Finger Probe w/ banana jack in handle (as required)

· BND-19: Child Test Finger Probe / Probe 19 of IEC 61032

· BND-18: Child Test Finger Probe / Probe 18 of IEC 61032

· BND-13: Test Pin Probe (short)

· BND-12: Test Pin Probe

· BND-D: 1.0mm Test Wire Probe / Test Probe D of IEC 61032

· BND-C: 2.5mm Test Rod Probe / Test Probe C of IEC 61032

· BND-11: Rigid Finger Probe

· BND-SG: IEC Test Hook (with means for connection to force gauge)

· BND-G500R: 50mm impact test ball w/ removable eyelet (as required)

· BND-G227: Impact Test Ball w/ Rockwell Hardness R62+ (as required)

· BND-TB12: Telecom Test Probe (to test accessibility to TNV circuits)

· CC-04: Two padded carrying cases